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IEEE and ODIN technologies Award Best RFID Paper
Wednesday, 16 April 2008 19:00
Las Vegas, NV, April 16, 2008 – The Institute of Electrical and Electronics Engineers (IEEE) and ODIN technologies announced the Best RFID Paper award winner for 2008, Tatsuya Inaba of the Keio Research Institute at Keio University in Japan.  For the second straight year, ODIN technologies sponsored the award and is proud of its continuing relationship with IEEE.  The award winning paper is selected by the members of the Program Committee and Organizing Committee for the IEEE International Conference on RFID 2008.  The paper was selected from 124 entries, a 15% increase over 2007.      The winning paper (Value of Sparse RFID Traceability Information in Asset Tracking during Migration Period) is a treatise on how to maximize value for Returnable Transport Items (RTI) or reusable containers through the use of RFID.  It is an important work for three reasons:   
  • It focuses on how to deliver maximum value from RFID for the specific application of tracking reusable containers
  • It discusses how container Rental Service Providers (RSP) can employ RFID to provide greater value to their customers
  • It provides a working model for predicting container location and the need for replacements

  “While many RFID papers and research programs logically focus on RFID performance and physics, Tatsuya Inaba breaks new ground with a model for validating and optimizing RFID value,” commented Patrick J. Sweeney II, founder of ODIN technologies and author of RFID for Dummies.  He added, “Both performance improvement and methods for discovering optimal return on investment are essential building blocks for realizing the potential of RFID.  The entire ODIN technologies team congratulates Mr. Inaba for his work and hope he continues to refine the models and expand his research to other application areas.  ODIN technologies is proud of our partnership with IEEE in supporting innovative RFID research and appreciate the diligent efforts of the review committee throughout the process.  ”  Dr. Daniel Engels of the IEEE International Conference on RFID and the Director, Texas Radio Frequency Innovation and Technology Center at the University of Texas at Arlington remarked, “The IEEE International Conference on RFID thanks ODIN technologies for its continued support of the Best Paper Award. We were extremely impressed with the research submitted this year and look forward to more innovative RFID research in 2009.  Tatsuya Inaba’s winning paper is a great example of the growing use models for RFID and a tangible way the academic community can support effective adoption of the technology.”  Mr. Tatsuya Inaba, the 2008 Best Paper award recipient added, “RFID is certainly a technology of accuracy and speed, but it is also more than that to users.  Many people don’t realize what we can do with RFID to achieve benefits.  We in the academic community need to think more about the consequences of the technology – what it can do for users.  That was the origin and intent of my paper.  I thank the IEEE and ODIN technologies for the honor of the Best Paper award.”  This is the second year that the IEEE International Conference on RFID has granted a Best Paper award and the second year sponsored by ODIN technologies.  The winner in 2007 was Christian Floerkemeier for his work titled Bayesian Transmission Strategy for Framed ALOHA based RFID Protocols. 

About ODIN technologies
ODIN technologies is the leader in RFID for solution design, research and deployment services and the emerging RFID automation software sector. RFID is all we do. Global corporations on five continents leverage ODIN technologies’ expert engineers and patented RFID automation tools to achieve accuracy, speed and visibility for their RFID deployments. In addition to consulting services, ODIN technologies is also the publisher of the RFID Benchmark Series™, the industry's first and most referenced head to head performance analysis of RFID equipment. ODIN’s RFID automation software suite EasyRFID™ has been successfully used at dozens of companies across more than 150 sites to ensure accurate RFID implementations. ODIN's President and CEO, Patrick J. Sweeney II, is the author of RFID for Dummies and CompTIA RFID+ study guide, both published by John Wiley & Sons. ODIN serves clients from offices in Dulles, Virginia, USA, Tokyo, Japan and Budapest, Hungary. www.ODINtechnologies.com